Spec EM Tech & Spectroscopy

Catalog #10636143

Laboratory course in which students perform tasks including voltage contrast, electron beam induced current (EBIC) and electron channeling. Presents other microscopy methods, such as secondary ion mass spectroscopy (SIMS), focus ion beam (FIB) and Auger microscopes. Prerequisite: grade of C or better in both 10-636-131 and 10-636-132.

Credits: 3

Prerequisites: Prerequisite: 10636131 and 10636132

Outline of Instruction

Course Offerings

last updated: 07:03:58 AM Nov 21 2008

This is a list of classes scheduled at various MATC locations. For complete, up-to-date information - including availability - please search for classes through Inside MATC.

Truax Campus

Catalog/Class # Semester Class Dates Meeting Times Instructor Mode of Instruction  

10636143
Class #53040 Spring 2008-2009 Jan 12 2009 -
May 13 2009 3:30 PM - 4:20 PM
M W Carmichael,William J  In Person