Students become proficient in the alignment procedures, operation and theory of transmission electron microscopes (TEMs). Introduction to basic theory and operation of atomic force microscopes (AFMs). X-ray microanalysis will also be introduced.
Credits: 4
Prerequisites:
This is a list of classes scheduled at various MATC locations. For complete, up-to-date information - including availability - please search for classes through Inside MATC.
Catalog/Class # Semester Class Dates Meeting Times Instructor Mode of Instruction
10636112
Class #23461
Fall 2008-2009
Aug 25 2008 -
Dec 19 2008
2:30 PM - 3:20 PM
M W F
Kostrna,Michael S
In Person